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Towards a mapping of software technical debt onto testware
Blekinge Tekniska Högskola, Fakulteten för datavetenskaper, Institutionen för programvaruteknik.
Blekinge Tekniska Högskola, Fakulteten för datavetenskaper, Institutionen för programvaruteknik.
2017 (engelsk)Inngår i: Proceedings - 43rd Euromicro Conference on Software Engineering and Advanced Applications, SEAA 2017, Institute of Electrical and Electronics Engineers Inc. , 2017, s. 404-411, artikkel-id 8051379Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

Technical Debt (TD) is a metaphor used to explain the negative impacts that sub-optimal design decisions have in the long-term perspective of a software project. Although TD is acknowledged by both researchers and practitioners to have strong negative impact on Software development, its study on Testware has so far been very limited. A gap in knowledge that is important to address due to the growing popularity of Testware (scripted automated testing) in software development practice.In this paper we present a mapping analysis that connects 21 well-known, Software, object-oriented TD items to Testware, establishing them as Testware Technical Debt (TTD) items. The analysis indicates that most Software TD items are applicable or observable as TTD items, often in similar form and with roughly the same impact as for Software artifacts (e.g. reducing quality of the produced artifacts, lowering the effectiveness and efficiency of the development process whilst increasing costs). In the analysis, we also identify three types of connections between software TD and TTD items with varying levels of impact and criticality. Additionally, the study finds support for previous research results in which specific TTD items unique to Testware were identified. Finally, the paper outlines several areas of future research into TTD. © 2017 IEEE.

sted, utgiver, år, opplag, sider
Institute of Electrical and Electronics Engineers Inc. , 2017. s. 404-411, artikkel-id 8051379
Emneord [en]
Mapping, Technical Debt, Testing, Testware, Application programs, Quality control, Software design, Software engineering, Software testing, Automated testing, Development process, Effectiveness and efficiencies, Long-term perspective, Software artifacts, Sub-optimal designs, Technical debts, Object oriented programming
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Identifikatorer
URN: urn:nbn:se:bth-15612DOI: 10.1109/SEAA.2017.65ISI: 000426074600060Scopus ID: 2-s2.0-85034416149ISBN: 9781538621400 (tryckt)OAI: oai:DiVA.org:bth-15612DiVA, id: diva2:1163523
Konferanse
43rd Euromicro Conference on Software Engineering and Advanced Applications, (SEAA), Vienna
Tilgjengelig fra: 2017-12-07 Laget: 2017-12-07 Sist oppdatert: 2018-03-23bibliografisk kontrollert

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