This paper is focused on the performance evaluation of Accelerated Tests (AT), which are carried out in a rapid manner to estimate life-length of a Device Under Test (DUT). Manufacturers need to preform ATs on the prototype of the product to anticipate its reliability and lifetime. The requirements for higher reliability impose tests of DUT's materials and components in advance. ATs expose products to different stressing environments, which include Electrical Stress, Mechanical Vibration, Temperature Shock, Temperature Cycling, Humidity, and others. An AT profile consists of different parameters, which depend on the DUT, and the most common are: a type of stress, rate of change, stress extreme points. Although these tests are accelerated, they are still time consuming. Furthermore, for large and complex DUTs, the test reliability itself can be doubted due to the involved diversity and uncertainty. In this paper, different experimental methods are applied to optimize the virtual test parameters to obtain reliable results. © 2020 IEEE.