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Performance Optimisation of Accelerated Tests: Simulation and Experimental Approach in Automotive Industry
Scania Cv Ab, SWE.
Blekinge Institute of Technology, Faculty of Engineering, Department of Mathematics and Natural Sciences.
2020 (English)In: Proceedings of the 2020 24th International Conference Electronics, ELECTRONICS 2020 / [ed] Andriukaitis D.,Valinevicius A.,Sledevic T., Institute of Electrical and Electronics Engineers Inc. , 2020, article id 9141623Conference paper, Published paper (Refereed)
Abstract [en]

This paper is focused on the performance evaluation of Accelerated Tests (AT), which are carried out in a rapid manner to estimate life-length of a Device Under Test (DUT). Manufacturers need to preform ATs on the prototype of the product to anticipate its reliability and lifetime. The requirements for higher reliability impose tests of DUT's materials and components in advance. ATs expose products to different stressing environments, which include Electrical Stress, Mechanical Vibration, Temperature Shock, Temperature Cycling, Humidity, and others. An AT profile consists of different parameters, which depend on the DUT, and the most common are: a type of stress, rate of change, stress extreme points. Although these tests are accelerated, they are still time consuming. Furthermore, for large and complex DUTs, the test reliability itself can be doubted due to the involved diversity and uncertainty. In this paper, different experimental methods are applied to optimize the virtual test parameters to obtain reliable results. © 2020 IEEE.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2020. article id 9141623
Keywords [en]
Industrial Electronics, Life Testing, Lifetime Estimation, Simulation, Design for testability, Reliability, Stresses, Vibrations (mechanical), Accelerated tests, Device under test, Electrical stress, Experimental approaches, Experimental methods, Performance optimisation, Temperature cycling, Test reliability, Testing
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:bth-20545DOI: 10.1109/IEEECONF49502.2020.9141623Scopus ID: 2-s2.0-85091979236ISBN: 9781728158686 (print)OAI: oai:DiVA.org:bth-20545DiVA, id: diva2:1476916
Conference
24th International Conference Electronics, ELECTRONICS 2020, Palanga, Lithuania, 15 June 2020 through 17 June 2020
Available from: 2020-10-16 Created: 2020-10-16 Last updated: 2020-10-16Bibliographically approved

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Kulesza, Wlodek

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