Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Towards a mapping of software technical debt onto testware
Blekinge Institute of Technology, Faculty of Computing, Department of Software Engineering.ORCID iD: 0000-0001-7526-3727
Blekinge Institute of Technology, Faculty of Computing, Department of Software Engineering.
2017 (English)In: Proceedings - 43rd Euromicro Conference on Software Engineering and Advanced Applications, SEAA 2017, Institute of Electrical and Electronics Engineers Inc. , 2017, p. 404-411, article id 8051379Conference paper, Published paper (Refereed)
Abstract [en]

Technical Debt (TD) is a metaphor used to explain the negative impacts that sub-optimal design decisions have in the long-term perspective of a software project. Although TD is acknowledged by both researchers and practitioners to have strong negative impact on Software development, its study on Testware has so far been very limited. A gap in knowledge that is important to address due to the growing popularity of Testware (scripted automated testing) in software development practice.In this paper we present a mapping analysis that connects 21 well-known, Software, object-oriented TD items to Testware, establishing them as Testware Technical Debt (TTD) items. The analysis indicates that most Software TD items are applicable or observable as TTD items, often in similar form and with roughly the same impact as for Software artifacts (e.g. reducing quality of the produced artifacts, lowering the effectiveness and efficiency of the development process whilst increasing costs). In the analysis, we also identify three types of connections between software TD and TTD items with varying levels of impact and criticality. Additionally, the study finds support for previous research results in which specific TTD items unique to Testware were identified. Finally, the paper outlines several areas of future research into TTD. © 2017 IEEE.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2017. p. 404-411, article id 8051379
Keywords [en]
Mapping, Technical Debt, Testing, Testware, Application programs, Quality control, Software design, Software engineering, Software testing, Automated testing, Development process, Effectiveness and efficiencies, Long-term perspective, Software artifacts, Sub-optimal designs, Technical debts, Object oriented programming
National Category
Software Engineering
Identifiers
URN: urn:nbn:se:bth-15612DOI: 10.1109/SEAA.2017.65ISI: 000426074600060Scopus ID: 2-s2.0-85034416149ISBN: 9781538621400 (print)OAI: oai:DiVA.org:bth-15612DiVA, id: diva2:1163523
Conference
43rd Euromicro Conference on Software Engineering and Advanced Applications, (SEAA), Vienna
Available from: 2017-12-07 Created: 2017-12-07 Last updated: 2021-03-31Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Alégroth, EmilGonzalez-Huerta, Javier

Search in DiVA

By author/editor
Alégroth, EmilGonzalez-Huerta, Javier
By organisation
Department of Software Engineering
Software Engineering

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 435 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf