Background. Unstable and unpredictable tests, herein referred to as flaky tests, pose a serious challenge to systems in the production environment. If a device is not tested thoroughly, it will be sent back for retesting from the production centers, which is an expensive affair. Removing flaky tests involves detecting the flaky tests, finding the causes of flakiness and finally the elimination of flakiness. The existing literature provides information on causes and elimination techniques of flakiness for software systems. All of these are studied thoroughly, and support is taken from interviews to understand they are applicable in the context of embedded systems. Objectives. The primary objective is to identify causes of flakiness in a device under test and also techniques for eliminating flakiness. Methods. In this paper, we applied a literature review to find the current state-of-art of flakiness. A case study is selected to address the objectives of the study. Interviews and observations carried out to collect data. Data analysis performed using a directed content analysis method. Results. Observations resulted in eliminating 4 causes of flakiness in embedded systems. Interview results in finding 4 elimination techniques which were not found in the literature. Conclusions. Causes and Elimination techniques for the domain of embedded systems are identified. Knowledge translation between the domains was carried out effectively.