Revisiting the Impact of Concept Drift on Just-in-Time Quality Assurance
2020 (English)In: Proceedings - 2020 IEEE 20th International Conference on Software Quality, Reliability, and Security, QRS 2020, Institute of Electrical and Electronics Engineers Inc. , 2020, p. 53-59, article id 9282807Conference paper, Published paper (Refereed)
Abstract [en]
The performance of software defect prediction(SDP) models is known to be dependent on the datasets used for training the models. Evolving data in a dynamic software development environment such as significant refactoring and organizational changes introduces new concept to the prediction model, thus making improved classification performance difficult. In this study, we investigate and assess the existence and impact of concept drift on SDP performances. We empirically asses the prediction performance of five models by conducting cross-version experiments using fifty-five releases of five open-source projects. Prediction performance fluctuated as the training datasets changed over time. Our results indicate that the quality and the reliability of defect prediction models fluctuate over time and that this instability should be considered by software quality teams when using historical datasets. The performance of a static predictor constructed with data from historical versions may degrade over time due to the challenges posed by concept drift. © 2020 IEEE.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2020. p. 53-59, article id 9282807
Keywords [en]
Concept drift, Defect prediction, Just-in-Time Quality assurance, Computer software selection and evaluation, Defects, Forecasting, Open source software, Software design, Software quality, Software reliability, Classification performance, Defect prediction models, Dynamic softwares, Open source projects, Organizational change, Prediction performance, Software defect prediction, Training data sets, Predictive analytics
National Category
Software Engineering
Identifiers
URN: urn:nbn:se:bth-20954DOI: 10.1109/QRS51102.2020.00020ISI: 000648778000008Scopus ID: 2-s2.0-85099295414ISBN: 9781728189130 (print)OAI: oai:DiVA.org:bth-20954DiVA, id: diva2:1521055
Conference
20th IEEE International Conference on Software Quality, Reliability, and Security, QRS 2020, Macau, China, 11 December 2020 through 14 December 2020
Note
open access
2021-01-222021-01-222021-06-28Bibliographically approved