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Logistic Regression for Enhancing FOPEN SAR Change Detection Performance
Blekinge Institute of Technology, Faculty of Engineering, Department of Mathematics and Natural Sciences.ORCID iD: 0000-0003-3945-8951
Blekinge Institute of Technology, Faculty of Engineering, Department of Mathematics and Natural Sciences.ORCID iD: 0000-0002-6643-312X
2025 (English)In: Proceedings of the IEEE Radar Conference, Institute of Electrical and Electronics Engineers (IEEE), 2025Conference paper, Published paper (Refereed)
Abstract [en]

The SAR change detection processing sequence includes SAR image stack formation (reference and surveillance), detection, and classification. The currently used approaches for classification in FOPEN SAR change detection are based on morphological operations such as erosion and dilation. In this paper, logistic regression, a supervised machine learning algorithm, is proposed for classification in FOPEN SAR change detection. The proposal is tested on the experimental data collected by the CARABAS system in 2002 over a dense forest. The test results indicate that logistic regression enhances the FOPEN SAR change detection performance. Specifically, the detection probability is 95% and the false alarm rate is 0.51 per square kilometer. 

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2025.
Series
IEEE International Conference on Radar (RADAR), ISSN 1097-5764, E-ISSN 2640-7736
Keywords [en]
change detection, classification, logistic regression, SAR, Geology, Image processing, Learning algorithms, Learning systems, Mathematical morphology, Morphology, Remote sensing, Signal detection, Supervised learning, CARABAS, Detection performance, Image stacks, Logistics regressions, Machine learning algorithms, Morphological operations, SAR Images, Stack formation, Supervised machine learning, Classification (of information)
National Category
Signal Processing
Identifiers
URN: urn:nbn:se:bth-28469DOI: 10.1109/RADAR52380.2025.11031538Scopus ID: 2-s2.0-105009412493ISBN: 9798331539566 (print)OAI: oai:DiVA.org:bth-28469DiVA, id: diva2:1988302
Conference
2025 IEEE International Radar Conference, RADAR 2025, Atlanta, May 3-9, 2025
Available from: 2025-08-11 Created: 2025-08-11 Last updated: 2025-09-30Bibliographically approved

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Vu, Viet ThuyPettersson, Mats

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